Products & Service

RF device

Applicable to testing GSG probe (including tip) configurations exceeding 67GHz.
Exclusive tip design not only stabilizes test performance, but also effectively increases the service life of the probe card.

Specification

Pitch

> 100µm

Tip Diameter

20µm

Frequency

< 67Ghz

Co-planarity

<10µm

Return Loss

<-10dB

Evenly positioned and consistent probe markings.
Stable probe contact force.
100% Taiwan made and with fast repair service.
Meet the testing needs of high-frequency RF, with low loss and high fidelity.

RF device

WAT device

In-House Service

LCD Driver device

Logic device

TF-MLC