Depending on the product to be tested by the customer, HTSI provides probe cards which are designed to withstand high voltage and high current, and applicable to logic IC testing and various test platforms (e.g., J750 / V9300 / M2 / C3xxx / STS, etc.).
Cantilever
Specification
Pitch
>45µm
C.C.C
>1A
Force
1.5g ~ 4g / mil
Cantilever
Minimum pad size: 30um * 30um
Minimum pitch: 45um
Vertical
Specification
Pitch
>50µm
C.C.C
500mA~1.6A
Force
0.5g ~ 3g / mil
Vertical
Applicable to various test platforms (e.g., J750/V9300/M2/STS, etc.).